Sistem Source-Meter testare lasere si foto diode Keithley 2520 pret test laser dioda laborator

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Surse reglabile > KEITHLEY (6) > Sistem Source-Meter testare lasere si foto diode Keithley 2520

 
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Sistem Source-Meter testare lasere si foto diode Keithley 2520



Produse recomandate

Sistem Source-Meter testare lasere si foto diode Keithley 2520

Cod: Keithley 2520
 
Keithley
 
 Datasheet Produs (*.PDF - 0.26 Mb)

» Specificatii tehnice

  • Simplifies laser diode LIV testing prior to packaging or active temperature control
  • Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
  • Sweep can be programmed to stop on optical power limit
  • Combines high accuracy source and measure capabilities for pulsed and DC testing
  • Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
  • Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
  • Pulse capability up to 5A, DC capability up to 1A
  • 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
  • Measurement algorithm increases the pulse measurement's signal-to-noise ratio
  • Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
  • Digital I/O binning and handling operations
  • IEEE-488 and RS-232 interfaces
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Produs: Sistem Source-Meter testare lasere si foto diode Keithley 2520 pret test laser dioda laborator