Pulsed Laser Diode Test System Keithley 2520 testing photo diodes price
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Power Supplies > KEITHLEY (6) > Pulsed Laser Diode Test System Keithley 2520
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Pulsed Laser Diode Test System Keithley 2520
Code: Keithley 2520
Product Datasheet (*.PDF - 0.26 Mb)» Technical Specs
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Simplifies laser diode LIV testing prior to packaging or active temperature control
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Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
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Sweep can be programmed to stop on optical power limit
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Combines high accuracy source and measure capabilities for pulsed and DC testing
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Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
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Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
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Pulse capability up to 5A, DC capability up to 1A
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14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
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Measurement algorithm increases the pulse measurement's signal-to-noise ratio
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Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
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Digital I/O binning and handling operations
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IEEE-488 and RS-232 interfaces
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