Sistem scanare/ masura emisii radiatii electromagnetice camp apropiat NoiseKen EPS-3007

Cod: NoiseKen EPS-3007


 

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Descriere

Niear field scanner system to "visualize" the inteference properties  of the circuit board

 

The EMC PRECISION SCAN is a scanner system to measure RF near-field emissions from a printed circuit board under test in normal offices or similar electromagnetic environments by utilizing an X-Y axis antenna probe scanning mechanism. The scanning results are represented on the user's PC monitor as frequency spectrum charts and field intensity distribution color maps, the latter of which is superimposed on the actual board image captured by the CCD camera mounted on the scanner main unit, allowing the user to easily locate the exact sources of emission.

 

FEATURES

  • Provides an amplitude versus frequency plot for each antenna probe position and field intensity distribution map by a single scan
  • Electric and magnetic fields are separately detected.
  • Wide and selectable frequency range
  • Fine resolution
  • 3D graphical representation and zoom capability for a given area
  • Comparison before and after a modification or improvement
  • Scanning by a single antenna probe to minimize error between each measurement point
  • 3GHz maximum frequency response (option)
  • Standard included three kinds of antenna probes (Probe A, Probe B and Probe C)
  • Simple and easy-to use

 

APPLICATIONS

This product is now used in the following applications. Our company is continuously developing various new applications in cooperation with our customers. For example:

 

  • Locates spots with higher field level compared to other spots
  • Locates spots with the frequency or frequency range in question, if any
  • Comparison of measurements resutls between before and after modifications in circuit design
  • Measurement for components
  • Evaluates the effectivness of EMI suppression components
  • Measurement for I/O cables
  • Measurement for the surface of small metal enclosure

 

 

SPECIFICATIONS

 

Main unit/Controller
 

Scanning method

Scanning of micro-electromagnetic field probe by XY stage

Analysis of detection signal

Analysis using spectrum analyzer

Frequency response

30MHz ~ 1.5GHz (standard)
30MHz ~ 3GHz (Option)

Low Frequency response (option)

150kHz ~ 100MHz

Control method

Control by personal computer
GP-IB interface, pulse motor control, image control

Scanning area

300 (length) x 350mm (Width) maximum

Scanning resolution

1.0mm x 1.0 mm (depending on an antenna probe)

Minimum scanning step

1mm/0.1mm step

Power supply

AC95~120, 210~250V 50/60Hz, 150VA

Dimensions and weight

(W) 601 x (H) 980 x (D) 662mm

Weight

Approx. 37kgs

Scanning probes

Probe A (for vertical magnetic field) , Probe B (for horizontal magnetic field), Probe C (for electric field)

Function

Scanning frequency range setting, Comparison, Filing and printing the measured data, Emission spectrum display, Search of source of maximum noise emission, Display of the emission intensities from the PCB under test, Synthesization of the emission data and overlaid on real-time image of the PCB



Personal Computer (Required specifications)

 

Compatible machine

IBM PC-AT compatible machine running the Windows® XP
Recommended CPU: Pentium® ?233MHz or higher
Main memory: 128M byte or more recommended
HDD: 100MB or more (dependinng on scanning data quantity)
Display mode: SVGA or XGA

OS

Microsoft® Windows®XP, WindowsVista®, Windows7®

Software

DirectX® version 2.0 after is necessary. (Direct® version 5.0 is recommended.)
Used for 3D display.

Expansion Slots

2 x full height PCI slots (for the Pulse Motor Board and the Video Board)
1 x full height PCIe slot or USB  (for the GP-IB Board)

Expansion Board

GP-IB Board (Using IRQ)
Pulse Motor Board (Not using IRQ)
Video Board (Using IRQ)



Measurement function

 

System of unit

Level: dBµV/dBm, Frequency: MHz (Linear scale)

Compatible spectrum analyzer

Agilent Technologies: E4402B
ADVANTEST: U3741
Anritsu: MS2661C

Please consult with our company about other supported analyzers.

 

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