YOKOGAWA AQ6374 Wide Range Optical Spectrum Analyzer 350 - 1750 nm

Cod: YOKOGAWA AQ6374 Wide Range Optical Spectrum Analyzer 350 – 1750 nm


 

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Descriere

The AQ6374 Wide Range Optical Spectrum Analyzer covers wavelengths from 350 to 1750 nm including visible lights (380 to 780 nm) and the telecommunication wavelengths.

 

World-Class Optical Performance

  • Wavelength range: 350 to 1750nm
  • High wavelength accuracy: ±0.05nm
  • High wavelength resolution: 0.05 to 10 nm
  • Wide dynamic range: 60dB (peak ±1.0nm)
  • Wide level range: +20 to -80dBm
  • Fast measurement: 0.5 sec. (100nm span)

 

Wavelength Resolution Settings:

There are 8 wavelength resolution settings: 0.05 to 10 nm
to enable the user to choose the best value according to the
device/system under test.

 

Measurable Level Range:

The wide measurable level range is from-80 to +20 dBm. This is suitable to measure high power as well as low power sources used in different fields of application.

 

Wavelength accuracy:

The ±0.05 nm wavelength accuracy can be maintained by the calibration using the built-in reference light source or an external light source including HeNe laser and Argon light source.

 

Fast measurement:

The instrument takes only 0.5 s for 100 nm span (with sensitivity set to NORM_AUTO).

 

Number of sampling: 100001

The number of wavelength samples has been doubled. One sweep can measure a wider wavelength range at high resolution.

 

Mouse and keyboard operation

More than 30 years of feedback from users have enabled intuitive and easy-to-use front panel operation. Mouse functionality provides ease of use for navigation and the keyboard helps to enter numbers and file names.

 

Trace zooming

  • Change display conditions, such as center wavelength and span, by clicking and dragging the mouse.
  • Enlarge your area of interest instantly and move it at will.
No need for another measurement to modify the display conditions
 

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• High wavelength resolution: 0.05 to 10 nm
• Wide dynamic range: 60dB (peak ±1.0nm)
• Wide level range: +20 to -80dBm
• Fast measurement: 0.5 sec. (100nm span)

 

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