USB Modular Digital I/O 96-channels Keitlhey KUSB-3160

• Choose from three sensitive electrometers for precision high resistance and low current measurements.

 

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• Measures resistances up to 10000TO
• 1fA - 20mA current measurement range
• <20 µV burden voltage on lowest current ranges
• 200 TO input impedance

 

• 6.5 digit DMM
• Single-instrument solution for continuity and hi-pot type leakage resistance measurements
• Programmable constant V source (50-500V) supports high speed, high resistance measurements
• Programmable constant I source (0-50mA) with dry circuit clamp helps prevent device stress or damage during low resistance measurements

 

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 16-bit resolution
• High and low programmable gains
• Input/output speeds up to 50kS/s
• Up to 17 digital lines for monitoring or control

 

• Multiplexer, matrix, and I/O cards
• Relay closures automatically counted and stored in each card's onboard memory

 

• 7.5 digit resolution
• 100nV rms noise floor
• 7ppm DCV repeatability

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 12-bit resolution
• High and low programmable gains
• Input/output speeds up to 100kS/s
• Up to 17 digital I/O lines

 

• Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meter
• Offers best-in-class performance with 6½-digit resolution.