• 16-bit resolution
• Input speeds of up to 250kS/s
• Output speeds of up to 200kS/s
• Digital I/O scanning speeds of up to 3MHz
• 32 single-ended or 16 differential analog inputs
• 16 digital I/O lines
• 2 analog outputs, waveform quality, 200kS/s

KEITHLEY DMM6500 6.5DIGIT MULTIMETER HIGH PRECISION

• 0.0025% DCV accuracy (1 year)
• 1 Msample/s digitizing, 16-bits
• 10-channel scan card option
• 100 nV
• 10 pA
• 1 µOhm

DIGITAL PRECISION MULTIMETER 8.5 DIGIT KEITHLEY DMM 2002

• 8.5 digit true resolution
• 8k Memory(optional 32k or 128k)
• Exceptional measurement integrity with high speed
• Broad range of built-in measurement functions

PRECISION DC CURRENT SOURCE KEITHLEY 6220

• Source and sink (programmable load) 100fA to 100mA
• 10^14 O output impedance ensures stable current sourcing into variable loads

KEITHLEY 2400 2450 2460 2461 2470 SMU SOURCE-METER SMU PRECISION MULTIMETER+SOURCE

• 6½-digit resolution precision source and measure
• 1 MSamples/s digitized measurement speed
• Current: 10 nA to 7 A DC, 10 A Pulse
• Voltage: 200 mV to 200 V
• Power: Up to 100 W DC to 1000 W Pulse

DATA ACQUISITION CARD PCI 16-CHANNELS 400KSA/S KEITLHEY KPCI-3104

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines
• 2 analog outputs

USB MODULAR DATA ACQUISITION UNIT USB 16-CHANNELS 50KSA/S KEITLHEY KUSB-3108

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 16-bit resolution
• High and low programmable gains
• Input/output speeds up to 50kS/s
• Up to 17 digital lines for monitoring or control

2-SLOT SYSTEM DMM, DATA ACQUISITION, SWITCH, DATALOGGER KEITHLEY 2700

• Combines functions of DMM, switch system, and datalogger
• True 6½-digit (22-bit) resolution
• Choice of 12 switch/control plug-in modules
• Up to 200 differential input channels

PULSED LASER DIODE TEST SYSTEM KEITHLEY 2520

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A