Electrometer High Resistance Meter Keithley 6517B

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

 

• 0.0025% DCV accuracy (1 year)
• 1 Msample/s digitizing, 16-bits
• 10-channel scan card option
• 100 nV
• 10 pA
• 1 µOhm

 

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• 1 mHz - 165 MHz frequency output range
• 2 channels
• 3 ns - 1000 s pulse width range
• 10 V amplitude into 50 O, 20 V into 1 k O

 

• 2601B, 2602B, 2604B System Sourcemeter SMU Instruments
• The 2601B, 2602B, and 2604B are 40W DC / 200W Pulse SMUs with 10 A pulse, 3A to 100 fA and 40 V to 100 nV DC capabilities.

 

• 6.5 digit DMM
• THD, THD+Noise and SINAD measurements
• 20Hz-20kHz sine wave generator
• 9.5Vrms single-ended or 19Vrms differential output
• Identifies peak spectral components(2016-P model)

 

• 6.5 digit DMM
• Single-instrument solution for continuity and hi-pot type leakage resistance measurements
• Programmable constant V source (50-500V) supports high speed, high resistance measurements
• Programmable constant I source (0-50mA) with dry circuit clamp helps prevent device stress or damage during low resistance measurements

 

• 6.5 digit DMM
• THD, THD+Noise and SINAD measurements
• 20Hz-20kHz sine wave generator
• 4Vrms single-ended or 8Vrms differential output
• Identifies peak spectral components(2015-P model)

 

• 0.0006% DCV accuracy (one year)
• 1nV, 100nΩ, and 10pA sensitivity
• DC in-circuit current and 15MHz frequency measurement

 

• 7.5 digit true resolution
• 8k Memory(optional 32k or 128k)
• Exceptional measurement integrity with high speed
• Broad range of built-in measurement functions