PCI Board Digital I/O 16-channels Optically Isolated Keithley KPCI-PDISO8A

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines
• 2 analog outputs

 

• 6.5 digit resolution
• 0.002% 90-day basic accuracy
• 2000 readings/second at 4-1/2 digits

 

• 2601B, 2602B, 2604B System Sourcemeter SMU Instruments
• The 2601B, 2602B, and 2604B are 40W DC / 200W Pulse SMUs with 10 A pulse, 3A to 100 fA and 40 V to 100 nV DC capabilities.

 

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

 

• The two-channel Model 2182A Nanovoltmeter is optimized for making stable, low noise voltage measurements and for characterizing low resistance materials and devices reliably and repeatably

 

• The cost-effective 5½-digit Model 6485 Picoammeter can measure currents from 10fA to 20mA, at speeds up to 1000 readings per second.

 

• Five instruments in one (IV Source, IVR Measure)
• Six models: 20 - 100W DC, 1000W pulsed, 1100V to 1uV, 10A to 10pA
• Source and sink (4-quadrant) operation
• 0.012% basic measure accuracy with 5½-digit resolution

 

• Choose from three sensitive electrometers for precision high resistance and low current measurements.

 

• 32 optically isolated solid-state relays and digital inputs
• Direct, non-polarized switching and sensing: DC up to 60VDC, AC up to 30Vrms
• High load current capability up to 350mA