The R&S^®FSV and the R&S^®FSVA are a family of versatile signal and spectrum analyzers for users working in the development, production, installation and servicing of RF systems.

The R&S^®FSV is the ideal instrument for all general-purpose measurement tasks – on the bench, in production, and in the field. It provides digital modulation analysis for the latest cellular and wireless standards with up to 160 MHz analysis bandwidth for measurements on components, chipsets and base stations.

Typical measurement tasks include standard-compliant spectrum emission mask measurements as well as spurious emission and adjacent channel leakage ratio (ACLR) measurements.

Measurement applications for EMI diagnostics, phase noise, noise figure, analog demodulation and vector signal analysis complete the range of functions offered by the versatile R&S^®FSV.

Features:

• Frequency range up to 4/7/13.6/30/40 GHz
• Up to 160 MHz signal analysis bandwidth
• Convenient, intuitive operation with touchscreen based user interface 5 GHz
• 0.4 dB level measurement uncertainty up to 7 GHz
• –110 dBc (1 Hz) phase noise at 10 kHz frequency offset
• +15 dBm third-order intercept (TOI)
• Displayed average noise level (DANL) in 1 Hz bandwidth: –155 dBm at 1 GHz, –147 dBm at 30 GHz; with R&S^®FSV-B24 preamplifier: –162 dBm at 30 GHz
• General-purpose measurement applications for phase noise, noise figure, vector signal analysis, analog demodulation, EMI diagnostics
• Wireless measurement applications for LTE (including LTE-Advanced), WLAN (including IEEE 802.11ac), WCDMA/HSPA+, TD-SCDMA, GSM/EDGE, CDMA2000^®/1xEV-DO, Bluetooth^®
• Frequency range up to 500 GHz with harmonics mixers
• Keeping test data confidential with removable solid state or hard disk drives