YOKOGAWA - Mini Clamp-on Tester CL120 (200A)

• Simultaneous 24 V loop power and mA measurement
• HART mode setting with loop power (250 OHM resistance)
• High accuracy signal measurement: DC mA 0.05%/30.000 mA
• Handheld DMM function
• Peak/Hold function for DCS power peak-to-peak measurement

 

• Source and sink operation up to 110 V/3.2 A (four-quadrant operation)
• Basic accuracy: ±0.02% (DC voltage generation)
• Sweep output at up to 100-µ intervals
• Comes with abundant sweep patterns (linear, logarithmic, and arbitrary)
• Stores up to 65535 points of source measure data in the internal memory

 

• High wavelength accuracy of ±0.3pm
• Cope with modulated light and optical filter measurement
• Simultaneous measurement of up to 1024 wavelengths
• Increase throughput with high speed measurement

 

• Lineup includes 200 MHz, 350 MHz, 500 MHz bandwidth models
• Lightweight and compact
• Large 8.4-inch LCD display
• Long memory: Up to 250 M points (with /M3 option)
• High speed sampling: Up to 2.5 GS/s (1.25 GS/s with 4 ch)

 

• Fast Acquisition
• Fast Transfer and Storage
• Easy to use
• Can operate "Standalone"

 

• 3 1/2-digit LCD;
• For each rating, you can save as many as 20 measurements at desired memory address numbers.
• Four AA (R6P) batteries the tester retains the measured resistance for approximately 5 seconds after the MEAS switch is turned off.

 

• Voltage & Currents
• Sensor Outputs
• Temperature, Vibration/Acceleration, Strain, Frequency
• Logic Signals & CAN / LIN and SENT

 

• Easy-to-view color display
• USB port for data storage
• Measurement module "hot-swapping" capability
• Remote monitoring and measurement through a LAN

 

• DC voltage/current reference, pulse voltage/current source
• V-I curve trace, semiconductor parametric test
• Programmable arbitrary waveform generation
• Electric load, resistance measurement
• Production test

 

• Full-color,high-resolution display with flexible display formats
• High-speed data logging with up to 30 k points per second
• High-capacity internal memory up to 100 k points
• Trend / histogram analysis available both in real-time and offline