The R&S^®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation technology, delivering extremely high sensitivity for phase noise measurements. As a result, it takes just seconds to measure even highly stable sources such as those found in radar applications. Additional options such as pulsed signal measurements, additive phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the analyzer a unique test instrument.

Features:

• Measuring phase and amplitude noise with high sensitivity
• Extremely low phase noise from internal sources
• Cross‑correlation to improve phase noise sensitivity
• Accuracy of amplitude noise measurements significantly higher than with diode detectors
• Display of improvement in sensitivity through cross‑correlation
• Up to 300 MHz frequency offset for phase noise measurements, up to 1 GHz for pure noise measurement
• Phase noise measurements on pulsed sources at the push of a button
• Simple test setup
• High sensitivity despite desensitization
• Automatic pulse parameter measurement
• Internal source for measuring additive phase noise, also on pulsed signals
• Simple and fast measurement
• Higher sensitivity through cross‑correlation
• Residual phase noise on pulsed signals
• Additional inputs for an external source
• Signal and spectrum analyzer and phase noise analyzer up to 50 GHz in a single box
• Simple, cost‑optimized test setup
• A worthwhile investment
• High-end signal and spectrum analyzer
• High measurement speed
• Perfect for production applications
• Faster development
• Low‑noise internal DC sources for VCO characterization
• Complete VCO characterization
• Measuring higher harmonics
• Phase noise relative to the tuning voltage
• Measuring transients or frequency hops (transient analysis)
• Up to 8 GHz bandwidth for frequency and phase analysis
• Triggering on phase or frequency deviation