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Basic Accuracy 0.05 %
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Measurement Functions L, C, R, |Z|, X, |Y|, G, B, D, Q, Θ, Δ, M, N
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Test Frequencies 20Hz…200kHz
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Up to 12 Measurements per Second
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Parallel and Series Mode
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Binning Interface HO118 (optional) for automatic Sorting of Components
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Internal programmable Voltage and Current Bias
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Transformer Parameter Measurement
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External Capacitor Bias up to 40V
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Kelvin Cable and 4 Wire SMD Test Adapter included in Delivery
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Galvanically isolated USB/RS-232 Interface, optional IEEE-488 (GPIB)