SPECTANO 100 - Dielectric Material Analyzer
Dielectric properties are very important to understand the relationship between the structure and the characteristics of materials. Usually material test systems belong to one of the following two categories:
- Time-domain systems to determine the polarization phenomena (PDC)
- Frequency Domain Spectroscopy (FDS) system for more detailed electrical properties analysis within the material.
The SPECTANO 100 combines the PDC and the FDS method in one device with a wide frequency range from 5 µHz to 5 kHz. It allows to measurement of all important dielectric material parameters such as permittivity ε, dielectric loss tanδ, capacitance and impedance. Due to the SPECTANO 100's the maximum output voltage of 200 Vpeak no additional external booster is needed.
Two measurement methods - one device
Polarization and depolarization current measurement (PDC) and frequency domain spectroscopy (FDS) in one device
Cost effective and powerful
Compact all-in-one system with up to 200 Vpeakoutput – no external booster needed.
Faster results
Test time reduced up to 75% by combined time and frequency domain measurement
Versatile application
The device enables floating measurement for integration in grounded application systems
Flexible and easy integration
Adapters and temperature resistant cables enable connection of all common test cell topologies
Easy data exchange
No license required to simplify data exchange and parallel analysis on several PCs
Measurement time reduction
PDC measurements can be accomplished in a short time but are limited to low frequencies. FDS measurements are feasible for high frequencies but take very long at low frequencies. SPECTANO 100 combines the advantages of both methods. The software transforms the time domain current into frequency domain data for subsequent evaluation. This reduces the measurement time up to 75 % compared to exclusive FDS measurements.
Reduced equipment cost
The SPECTANO 100 is a light-weight all-in-one system. The max. 200 Vpeak output in time- and frequency domain allows measurements without the need of an additional voltage booster.
System quality check and data backup
The SPECTANO 100 software provides different pre-measurements to check the test system before starting a measurement to guarantee cost and time saving work. Functions like Load from device or Save data to back-up file ensure that the test data and results remain accessible in error cases like an accidental disconnection of the device during measurement
Multiple setups and potential free measurements
The SPECTANO 100 device and its cables and adapters allow floating measurements for implementation in grounded application systems and a high variety of measurement setups (e.g. for measurements with high voltages).
Easy data exchange
To simplify data exchange and to enable parallel analysis of measurement results on several PCs the SPECTANO analyzer suite can be installed without the need of a specific software license.
Easy integration and quick familiarization
Optional adapters (BNC and 4mm plugs) allow a flexible connection to all common material test cells in the market. Temperature resistant cables and adapters allow to connect the SPECTANO 100 test cells located in a temperature controlled environment from -55 °C to +250 °C. Straight forward simple connection methods in combination with the intuitive SPECTANO analyzer suite software result in a quick familiarization with the test setup.
Applications
Characterize the insulation, polarization and dielectric loss of solid and liquid materials such as:
- Electrical insulation paper/cellulose
- Nanomaterials (Nano-composites)
- Dielectric components
- Epoxy resins
- Mica
- Polymers
- Insulation Oils
- Display technologies like glasses or polymers
- Thin films
Achieve information on:
- Dielectric properties
- Material aging
- Material structure
- Space charges in multilayer insulations
- Surface or film thickness of coatings
- Curing processes
Voltage Source
Output voltage: |
± 100 mVpeak to ± 200 Vpeak |
Max. output current |
50 mApeak |
Frequency Domain Spectroscopy (FDS)
Measurement current: |
max. ± 50 mApeak |
Frequency range: |
5 μHz to 5 kHz |
Time Domain Current Measurement (PDC)
Measurement current: |
max. 10 mA |
Frequency range: |
20 µHz to 100 mHz |
Input resistance: |
2 kΩ |
Combined Mode (FDS and PDC)
Frequency range: |
20 μHz to 5 kHz |
Time reduction: |
Up to 75 % in comparison to exclusive FDS measurements |
Capacitance, Dissipation Factor and Impedance
Tanδ range: |
0 to 10 |
Capacitance range: |
10 pF to 100 μF |
Impedance range: |
100 Ω to 20 TΩ |
System Requirements
Operating system: |
Windows 7 SP1, 8, 10 or higher; 32-bit and 64-bit |
CPU: |
Current Intel or AMD CPU |
RAM |
min. 2 GB |
Interface |
USB 2.0 or higher |
AC Power Supply
For safety reasons only use grounded DRA power supply which is delivered with the SPECTANO 100.
DO NOT use any other power supply.
Environmental Conditions of Device (not accessories)
Operation temperature: |
-10 °C to +55 °C / -31 °F to +131 °F |
Storage temperature: |
-10 °C to +65 °C / -31 °F to +149 °F |
Relative humidity: |
10 % to 95 % non-condensing |
Air pressure: |
70 kPa to 106 kPa |
Mechanical Data
Dimensions: |
260 x 50 x 256 mm / 10.25 x 2 x 10.5 inch (w x h x d) |
Weight: |
2.3 kG / 5 Ib |