USB Modular Data Acquisition Unit USB 8-channels 50kSa/s Keitlhey KUSB-3100

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines

 

• 16 optically isolated solid-state relays and digital inputs
• Direct, non-polarized switching and sensing: DC up to 60VDC, AC up to 30Vrms
• High load current capability up to 350mA

 

• 7.5 digit resolution
• 100nV rms noise floor
• 7ppm DCV repeatability

 

• USB 2.0 and USB 1.1, true plug-and-play compatibility
• 16 SE/pseudo-DI/ 8 DI analog input channels
• 12-bit resolution
• High and low programmable gains
• Input/output speeds up to 100kS/s
• Up to 17 digital I/O lines

 

• <1fA noise
• >200TO input impedance on voltage measurements
• Charge measurements from 10fC to 20µC
• High speed -- up to 1200 readings/second

 

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• 0.0014% DCV accuracy (one year)
• 1,000,000 readings/s digitizer
• Touchscreen display
• DC voltage sensitivity: 10 nV
• Current sensitivity: 1 pA
• Resistance sensitivity: 0.1 µΩ

 

• 6.5 digit DMM
• THD, THD+Noise and SINAD measurements
• 20Hz-20kHz sine wave generator
• 9.5Vrms single-ended or 19Vrms differential output
• Identifies peak spectral components(2016-P model)

 

• Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meter
• Offers best-in-class performance with 6½-digit resolution.

 

• 1 mHz - 165 MHz frequency output range
• 2 channels
• 3 ns - 1000 s pulse width range
• 10 V amplitude into 50 O, 20 V into 1 k O