USB Modular Data Acquisition Unit USB 8-channels 50kSa/s Keitlhey KUSB-3100

• 1 mHz - 165 MHz frequency output range
• 1 channel
• 3 ns - 1000 s pulse width range
• 10 V amplitude into 50 O, 20 V into 1 k O

 

• Make low noise measurements at high speeds
• typically just 15 nV p-p noise at 1s response time
• 40..50 nV p-p noise at 60ms

 

• 2 DMMs in 1U high enclosure
• 1 Msample/s, 18-bit digitizers
• 10 nV, 0.1 µΩ and 1 pA sensitivities

 

• 6.5 digit DMM
• THD, THD+Noise and SINAD measurements
• 20Hz-20kHz sine wave generator
• 9.5Vrms single-ended or 19Vrms differential output
• Identifies peak spectral components(2016-P model)

 

• 1 mHz - 165 MHz frequency output range
• 2 channels
• 3 ns - 1000 s pulse width range
• 10 V amplitude into 50 O, 20 V into 1 k O

 

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A

 

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines

 

• 12-bit resolution
• Throughput of up to 400kS/s
• Digital I/O scanning speeds of up to 3MHz
• 16 single-ended or 8 differential analog inputs
• 23 digital I/O lines
• 2 analog outputs

 

• Source and sink (programmable load) 100fA to 100mA
• 10^14 O output impedance ensures stable current sourcing into variable loads

 

• Five instruments in one (IV Source, IVR Measure)
• Six models: 20 - 100W DC, 1000W pulsed, 1100V to 1uV, 10A to 10pA
• Source and sink (4-quadrant) operation
• 0.012% basic measure accuracy with 5½-digit resolution