Bench-Top Digital IC Tester.

The GUT-6000B is a desktop digital IC tester. Oriented toward automating testing tasks, the GUT-6000B contains high-end features such as auto-search and loop testing. Automated processes provide an intelligent and continuous process for detecting defective ICs. Self-diagnosis functions and over-load protection mechanisms make the GUT-6000A close to maintenance-free, releasing users from unnecessary hassles. The wide device coverage includes the 1800 series as well as the ubiquitous TTL and CMOS, providing a one-size fits-all solution for an IC testing bench area.

Features:

• Loop Test
• Auto-Search
• Self-Diagnosis
• Over-Load Protection
• Measures 1800 Kinds of Device
• 54/74 Series TTL
• 4000 and 4500 Series CMOS
• Test Socket: 28 Pin